1 May 2012 An infrared polarized scene generator for hardward-in-the-loop (HWIL) testing
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Abstract
Polarization signature information is becoming more useful as an added discriminant in a variety of signature analysis applications. However, there are few infrared scene projection systems that provide the capability to inject object simulation images with polarization content into an imaging sensor. In this paper, we discuss a polarization scene generator that is applicable to testing polarimetric sensor systems. The system was originally designed for operation in cryogenic-vacuum environments to test sensors subject to cold operation. However, it is also applicable to testing warm sensors that are sensitive to polarimetric signatures. This polarization scene generator is currently designed for mid-wave infrared (MWIR) operation. It includes two table-top sparse emitter arrays with individually addressable pixels, polarizers, a beam combiner, and filters to provide flexibility in spectral content. The emitter arrays are combined to generate an output with independent linearly polarized content. The current system generates S1 polarization states, S2 polarization states, or a linear combination of the two. The concept is robust because it is relatively unconstrained by the infrared (IR) scene generators used or the sensors tested.
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Peter S. Erbach, Joseph L. Pezzaniti, David B. Chenault, John Reinhardt, Todd Aycock, Brian Hyatt, Heard S. Lowry, "An infrared polarized scene generator for hardward-in-the-loop (HWIL) testing", Proc. SPIE 8356, Technologies for Synthetic Environments: Hardware-in-the-Loop XVII, 835607 (1 May 2012); doi: 10.1117/12.920158; https://doi.org/10.1117/12.920158
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