Characterization of CdZnTe crystals and radiation detectors

J. Butcher; M. Hamade; M. Petryk; A. E. Bolotnikov; G. S. Camarda; Y. Cui; R. Gul; A. Hossain; K. H. Kim; G. Yang; R. B. James

doi:10.1117/12.916951

15 May 2012 Characterization of CdZnTe crystals and radiation detectors

J. Butcher, M. Hamade, M. Petryk, A. E. Bolotnikov, G. S. Camarda, Y. Cui, R. Gul, A. Hossain, K. H. Kim, G. Yang, R. B. James

Author Affiliations +

Proceedings Volume 8358, Chemical, Biological, Radiological, Nuclear, and Explosives (CBRNE) Sensing XIII; 83581M (2012) https://doi.org/10.1117/12.916951
Event: SPIE Defense, Security, and Sensing, 2012, Baltimore, Maryland, United States

Abstract

Data obtained with BNL's National Synchrotron Light Source (NSLS) has helped to elucidate, in detail, the roles of non-uniformity and extended defects on the performance of CZT detectors, as well as the root cause of device polarization during exposure to a high flux of incident X-rays. Measurements of carrier traps will be reported, including their nature and relationships to different growth methods (conventional Bridgman, high-pressure Bridgman, traveling heater, and floating zone methods). Most findings will be correlated with the performance of spectrometer-grade CZT Xray and gamma detectors, and new directions to resolve the material deficiencies will be offered.

Citation Download Citation

J. Butcher, M. Hamade, M. Petryk, A. E. Bolotnikov, G. S. Camarda, Y. Cui, R. Gul, A. Hossain, K. H. Kim, G. Yang, and R. B. James "Characterization of CdZnTe crystals and radiation detectors", Proc. SPIE 8358, Chemical, Biological, Radiological, Nuclear, and Explosives (CBRNE) Sensing XIII, 83581M (15 May 2012); https://doi.org/10.1117/12.916951

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