22 June 2012 Entropyology: microarray analysis analogy for digital artifact discrimination
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Abstract
We successfully introduce an analogy of microarray analysis for robust exemplar selection to enable optimal classification. The microarray is analogous to the Spatial Voting (SV) grid, where digital artifacts are stacked onto the grid and grid cells are colored red if only the experiment samples (Class 1) are present, green if only control samples (Class 2) are present, and yellow if both classes are present. We use this information to determine if the exemplars are to be placed in the training, validation, or test dataset. The bytes of these digital artifacts are converted into ASCII values, characterized using the recursive form of higher order parametric and non-parametric statistics, and classifiers derived for discrimination and classification. The results and findings of our work are presented here.
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Holger Jaenisch, James Handley, "Entropyology: microarray analysis analogy for digital artifact discrimination", Proc. SPIE 8359, Sensors, and Command, Control, Communications, and Intelligence (C3I) Technologies for Homeland Security and Homeland Defense XI, 83590A (22 June 2012); doi: 10.1117/12.914730; https://doi.org/10.1117/12.914730
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KEYWORDS
Data modeling

Statistical analysis

Defense and security

Binary data

Optical character recognition

Principal component analysis

Fractal analysis

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