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9 May 2012 Ultrahigh sensitive plasmonic terahertz detectors based on an asymmetric dual-grating gate HEMT structure
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Abstract
We report on ultrahigh sensitive, broadband terahertz (THz) detectors based on asymmetric double-grating-gate (A-DGG) high electron mobility transistors, demonstrating a record responsivity of 2.2 kV/W at 1 THz with a superior low noise equivalent power of 15 pW/√Hz using InGaAs/InAlAs/InP material systems. When THz radiation is absorbed strong THz photocurrent is first generated by the nonlinearity of the plasmon modes resonantly excited in undepleted portions of the 2D electron channel under the high-biased sub-grating of the A-DGG, then the THz photovoltaic response is read out at high-impedance parts of 2D channel under the other sub-grating biased at the level close to the threshold. Extraordinary enhancement by more than two orders of magnitude of the responsivity is verified with respect to that for a symmetric DGG structure.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Taiichi Otsuji, Stephane Boubanga-Tombet, Takayuki Watanabe, Yudai Tanimoto, Akira Satou, Tetsuya Suemitsu, Yuye Wang, Hiroaki Minamide, Hiromasa Ito, Yahya Moubarak Meziani, Dominique Coquillat, Wojciech Knap, Denis Fateev, and Viacheslav Popov "Ultrahigh sensitive plasmonic terahertz detectors based on an asymmetric dual-grating gate HEMT structure", Proc. SPIE 8363, Terahertz Physics, Devices, and Systems VI: Advanced Applications in Industry and Defense, 83630P (9 May 2012); https://doi.org/10.1117/12.919978
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