3 May 2012 Nanoscale chemical composition mapping of polymers at 100nm spatial resolution with AFM-based IR spectroscopy
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Abstract
Atomic Force Microscopy (AFM) and infrared (IR) spectroscopy have been combined in a single instrument capable of producing sub-micron spatial resolution IR spectra and images. This new capability enables the sprectroscopic characterization of microdomain-forming polymers at levels not previously possible. Films of poly(3-hydroxybutyrate-co-3-hydroxyheanoate) were solution cast on ZnSe prisms. Dramitic differences in the IR spectra are observed in the 1200-1300 cm-1 range as a funstion of position on a spatial scale of less than one micron. This spectral region is particularly sensitive to the polymer crystallinity, enabling the identification of crystalline and amorphous domains within a single spherulite of this polymer.
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Michael Lo, Michael Lo, Craig Prater, Craig Prater, Alexandre Dazzi, Alexandre Dazzi, Roshan Shetty, Roshan Shetty, Kevin Kjoller, Kevin Kjoller, } "Nanoscale chemical composition mapping of polymers at 100nm spatial resolution with AFM-based IR spectroscopy", Proc. SPIE 8373, Micro- and Nanotechnology Sensors, Systems, and Applications IV, 83730L (3 May 2012); doi: 10.1117/12.919809; https://doi.org/10.1117/12.919809
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