18 May 2012 A new high-resolution, high-throughput spectrometer: first experience as applied to Raman spectroscopy
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Proceedings Volume 8374, Next-Generation Spectroscopic Technologies V; 83740V (2012); doi: 10.1117/12.919062
Event: SPIE Defense, Security, and Sensing, 2012, Baltimore, Maryland, United States
Abstract
The classic trade-off between resolution and throughput in a dispersive spectrometer is overcome using virtual slit technology. An optimized spectrometer designed from the ground up to incorporate a virtual slit is experimentally demonstrated by Raman experiments.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jeffrey T. Meade, Bradford B. Behr, Arsen R. Hajian, "A new high-resolution, high-throughput spectrometer: first experience as applied to Raman spectroscopy", Proc. SPIE 8374, Next-Generation Spectroscopic Technologies V, 83740V (18 May 2012); doi: 10.1117/12.919062; https://doi.org/10.1117/12.919062
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KEYWORDS
Spectroscopy

Raman spectroscopy

Spectral resolution

Collimation

Solids

Photons

Spectrometer engineering

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