PROCEEDINGS VOLUME 8378
SPIE DEFENSE, SECURITY, AND SENSING | 23-27 APRIL 2012
Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
Proceedings Volume 8378 is from: Logo
SPIE DEFENSE, SECURITY, AND SENSING
23-27 April 2012
Baltimore, Maryland, United States
Front Matter
Proc. SPIE 8378, Front Matter: Volume 8378, 837801 (14 May 2012); https://doi.org/10.1117/12.979457
Scanning Microscopies for Micro and Nanotechnology Applications: Joint Session with 8373
Proc. SPIE 8378, Past, present, and future of backscatter electron (BSE) imaging, 837802 (14 May 2012); https://doi.org/10.1117/12.920001
Proc. SPIE 8378, Faults and foibles of quantitative scanning electron microscopy/energy dispersive x-ray spectrometry (SEM/EDS), 837803 (14 May 2012); https://doi.org/10.1117/12.912770
Proc. SPIE 8378, Does your SEM really tell the truth?, 837805 (14 May 2012); https://doi.org/10.1117/12.917689
Atomic Force Microscopy for Imaging and Metrology I
Proc. SPIE 8378, Progress on CD-AFM tip width calibration standards, 83780B (14 May 2012); https://doi.org/10.1117/12.921597
Proc. SPIE 8378, Atomic force microscope cantilevers as encoder for real-time displacement measurements, 83780C (14 May 2012); https://doi.org/10.1117/12.923005
Atomic Force Microscopy for Imaging and Metrology II
Proc. SPIE 8378, Hybrid metrology for critical dimension based on scanning methods for IC manufacturing, 83780F (14 May 2012); https://doi.org/10.1117/12.919650
Proc. SPIE 8378, Deformation of polystyrene nanoparticles under different AFM tapping loads, 83780G (14 May 2012); https://doi.org/10.1117/12.921451
Proc. SPIE 8378, Extension of gravity center method for diameter calibration of polystyrene standard particles with a metrological AFM, 83780J (14 May 2012); https://doi.org/10.1117/12.918528
Modeling
Proc. SPIE 8378, Image processing with Maple for simplified analysis in scanning microscopy, 83780N (14 May 2012); https://doi.org/10.1117/12.918415
Particle Beam Microscopies I
Proc. SPIE 8378, Nanomanipulation system for scanning electron microscope, 83780O (14 May 2012); https://doi.org/10.1117/12.919683
Proc. SPIE 8378, Multi-signal FIB/SEM tomography, 83780P (14 May 2012); https://doi.org/10.1117/12.919821
Proc. SPIE 8378, Advances in high-speed low-latency communications for nanopositioning in advanced microscopy, 83780R (14 May 2012); https://doi.org/10.1117/12.919237
Particle Beam Microscopies II
Proc. SPIE 8378, Improving the performance of the critical dimension-scanning electron microscope with the contrast transfer function, 83780T (14 May 2012); https://doi.org/10.1117/12.919293
Special Session on Microscopy for STEM Educators I
Proc. SPIE 8378, Forensic practice in the field of protection of cultural heritage, 83780Y (14 May 2012); https://doi.org/10.1117/12.919290
Proc. SPIE 8378, Integrating research and advanced microscopy into the high school curriculum, 837811 (14 May 2012); https://doi.org/10.1117/12.923443
Microscopies for Nanotechnological Applications
Proc. SPIE 8378, Robust probes for high resolution chemical detection and imaging, 837813 (14 May 2012); https://doi.org/10.1117/12.919828
Proc. SPIE 8378, Response of electrospun CNT composites to irradiation, 837815 (14 May 2012); https://doi.org/10.1117/12.920462
Special Session on Microscopy for STEM Educators I: addendum
Proc. SPIE 8378, Introduction to special session on microscopy for Science, Technology, Engineering and Math (STEM) educators, 837817 (2 December 2014); https://doi.org/10.1117/12.2183085
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