PROCEEDINGS VOLUME 8378
SPIE DEFENSE, SECURITY, AND SENSING | 23-27 APRIL 2012
Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
Proceedings Volume 8378 is from: Logo
SPIE DEFENSE, SECURITY, AND SENSING
23-27 April 2012
Baltimore, Maryland, United States
Front Matter: Volume 8378
Proc. SPIE 8378, Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences, 837801 (14 May 2012); doi: 10.1117/12.979457
Scanning Microscopies for Micro and Nanotechnology Applications: Joint Session with 8373
Proc. SPIE 8378, Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences, 837802 (14 May 2012); doi: 10.1117/12.920001
Proc. SPIE 8378, Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences, 837803 (14 May 2012); doi: 10.1117/12.912770
Proc. SPIE 8378, Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences, 837805 (14 May 2012); doi: 10.1117/12.917689
Atomic Force Microscopy for Imaging and Metrology I
Proc. SPIE 8378, Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences, 83780B (14 May 2012); doi: 10.1117/12.921597
Proc. SPIE 8378, Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences, 83780C (14 May 2012); doi: 10.1117/12.923005
Atomic Force Microscopy for Imaging and Metrology II
Proc. SPIE 8378, Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences, 83780F (14 May 2012); doi: 10.1117/12.919650
Proc. SPIE 8378, Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences, 83780G (14 May 2012); doi: 10.1117/12.921451
Proc. SPIE 8378, Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences, 83780J (14 May 2012); doi: 10.1117/12.918528
Modeling
Proc. SPIE 8378, Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences, 83780N (14 May 2012); doi: 10.1117/12.918415
Particle Beam Microscopies I
Proc. SPIE 8378, Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences, 83780O (14 May 2012); doi: 10.1117/12.919683
Proc. SPIE 8378, Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences, 83780P (14 May 2012); doi: 10.1117/12.919821
Proc. SPIE 8378, Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences, 83780R (14 May 2012); doi: 10.1117/12.919237
Particle Beam Microscopies II
Proc. SPIE 8378, Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences, 83780T (14 May 2012); doi: 10.1117/12.919293
Special Session on Microscopy for STEM Educators I
Proc. SPIE 8378, Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences, 83780Y (14 May 2012); doi: 10.1117/12.919290
Proc. SPIE 8378, Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences, 837811 (14 May 2012); doi: 10.1117/12.923443
Microscopies for Nanotechnological Applications
Proc. SPIE 8378, Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences, 837813 (14 May 2012); doi: 10.1117/12.919828
Proc. SPIE 8378, Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences, 837815 (14 May 2012); doi: 10.1117/12.920462
Special Session on Microscopy for STEM Educators I: addendum
Proc. SPIE 8378, Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences, 837817 (2 December 2014); doi: 10.1117/12.2183085
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