14 May 2012 Front Matter: Volume 8378
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Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 8378, including the Title Page; Copyright information; Table of Contents; Introduction; Introduction to Special Session on Microscopy for Science, Technology, Engineering and Math (STEM) Educators, and the Conference Committee listing.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Proceedings of SPIE, "Front Matter: Volume 8378", Proc. SPIE 8378, Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences, 837801 (14 May 2012); doi: 10.1117/12.979457; http://dx.doi.org/10.1117/12.979457
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KEYWORDS
Microscopy

Scanning transmission electron microscopy

Standards development

Defense technologies

Scanning electron microscopy

Defense and security

Electron microscopes

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