4 May 2012 Methodology for designing M&S that integrates V&V processes and documentation
Author Affiliations +
Abstract
This paper presents a method that integrates Modeling and Simulation (M&S) Verification and Validation (V&V) as part of the M&S design. Experience indicates that in the past, very few models were developed with V&V as part of the design process. Formal V&V was usually done after the model had been released to the user community and was being used by major programs to support major decisions. This has changed in recent years as declining resources have resulted in a growing reliance on M&S. As awareness of the issues and the risks involved has increased, Department of Defense (DoD) policies have been written that require V&V to be implemented as part of the M&S design, development, and acquisition process. Many things can go wrong when a model is not carefully verified and validated. Not only does lack of V&V make a model difficult, if not impossible, to use, but the model may fail to support its intended use. V&V reduces the risks of developing an M&S that does not meet requirements or of using an inappropriate simulation to support a decision. While risks can never be eliminated entirely, they can be quantified in a way that they provide the decision maker with an indication of how high the cost of using an erroneous M&S result can be. This approach therefore allows optimal decisions to be made. This paper gives a description of a methodology for implementing V&V processes and documentation into the M&S design process.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
James N. Elele, Nancy Gould, "Methodology for designing M&S that integrates V&V processes and documentation", Proc. SPIE 8403, Modeling and Simulation for Defense Systems and Applications VII, 84030G (4 May 2012); doi: 10.1117/12.921436; https://doi.org/10.1117/12.921436
PROCEEDINGS
6 PAGES


SHARE
RELATED CONTENT

Theoretical foundations of die-to-model inspection
Proceedings of SPIE (October 06 2009)
A methodology to weight OPC modeling data points
Proceedings of SPIE (May 20 2006)
J-MASS model verification and validation
Proceedings of SPIE (August 24 1998)
Joint modeling and simulation system
Proceedings of SPIE (August 31 1993)
Validating instrument models through the calibration process
Proceedings of SPIE (September 08 2006)

Back to Top