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1 November 2012 Autocorrelation diagnostics of phase singularities in diffracted optical fields
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Proceedings Volume 8411, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies VI; 841109 (2012) https://doi.org/10.1117/12.966373
Event: Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies 2012, 2012, Constanta, Romania
Abstract
The autocorrelation technique applied to diagnostics of phase singularities arising in diffraction patterns is presented for the first time. The proposed technique is based on the Young-Rubinowicz model of diffraction phenomena (model of the edge diffraction wave) and consists in analysis of bending or shift of interference fringes, which are produced by the waves from two edges of narrow opaque strip placed in the beam. This original approach has been applied previously for detection and diagnostics of optical vortices in Laguerre-Gaussian beams, in combined partially coherent/ partially polarized beams as well as in speckle fields. Here we show applicability of the same experimental approach for detecting another type of optical singularities, viz. edge (rather than screw) dislocations of optical wave fronts. Such technique is of especial importance when the use of separate reference wave (cross-correlation approach) is hampered due to incomplete spatial coherence of the analyzed beam or its complex polarization structure. We demonstrate practicability of the proposed technique with instructive examples of typical diffraction patters both in Fraunhofer and Fresnel zones. Besides, our experiments show structural stability of edge dislocations in diffraction patterns. Namely, if even amplitude zeroes are ‘hidden’, then autocorrelation technique provides detecting at least component singularity.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ch. V. Felde, M. V. Oleksyuk, P. V. Polyanskii, and H. V. Bogatyryova "Autocorrelation diagnostics of phase singularities in diffracted optical fields", Proc. SPIE 8411, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies VI, 841109 (1 November 2012); https://doi.org/10.1117/12.966373
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