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1 November 2012 Continuous wavelet transform for d-space distribution analysis in nanocrystallic materials
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Proceedings Volume 8411, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies VI; 84110A (2012) https://doi.org/10.1117/12.966390
Event: Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies 2012, 2012, Constanta, Romania
Abstract
We present a novel application of the continuous wavelet transform (CWT) for quantitative analysis of electron diffraction fringe patterns for material science research. With this method unsupervised analysis of large data sets can be performed, to determine statistical distribution of fringe periods, corresponding to the spacing between the planes in the atomic lattice. It is more robust and less time consuming than typical manual approach. Obtained information can be further utilized for characterization and identification of the crystallographic structures present in the sample. The proposed method is applied to analysis of high resolution transmission electron microscope (HRTEM) images of Iridium-Zinc-Silicon-Oxide thin films, which reveal nanocrystallic structures dispersed in an amorphous matrix.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Maciej Wielgus, Jakub Grochowski, Eliana Kamińska, and Krzysztof Patorski "Continuous wavelet transform for d-space distribution analysis in nanocrystallic materials", Proc. SPIE 8411, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies VI, 84110A (1 November 2012); https://doi.org/10.1117/12.966390
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