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11 September 2012 Speckle interferometry based on spatial fringe analysis method using only two speckle patterns
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Proceedings Volume 8413, Speckle 2012: V International Conference on Speckle Metrology; 84130F (2012) https://doi.org/10.1117/12.975753
Event: SPECKLE 2012: V International Conference on Speckle Metrology, 2012, Vigo, Spain
Abstract
Electronic speckle pattern interferometry is a useful deformation measurement method. In this paper, new speckle interferometry that can measure the deformation with a concave shape distribution based on spatial fringe analysis method by using only two speckle patterns is proposed. The optical system that can record some spatial information into each speckle of speckle pattern is set up by using basic characteristics of speckle phenomenon that has never been used before. In experimental results, it is confirmed that the out-of-plane deformation measurement by using only two speckle patterns before and after the deformation can be precisely performed by this method.
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Yasuhiko Arai, Takuya Inoue, and Shunsuke Yokozeki "Speckle interferometry based on spatial fringe analysis method using only two speckle patterns", Proc. SPIE 8413, Speckle 2012: V International Conference on Speckle Metrology, 84130F (11 September 2012); https://doi.org/10.1117/12.975753
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