11 September 2012 A fast and robust approach to phase shift registration from randomly phase shifted interferograms
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Proceedings Volume 8413, Speckle 2012: V International Conference on Speckle Metrology; 84130R (2012) https://doi.org/10.1117/12.978027
Event: SPECKLE 2012: V International Conference on Speckle Metrology, 2012, Vigo, Spain
Abstract
We present a fast and robust approach to phase shift registration from randomly phase shifted interferograms. The approach is based on a singular value decomposition followed by an iterative, projection based optimization procedure. Compared to known algorithms it is fast and shows comparable or better registration quality depending on the case of application.
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Alexander Hildebrand, Alexander Hildebrand, Claas Falldorf, Claas Falldorf, Christoph von Kopylow, Christoph von Kopylow, Ralf B. Bergmann, Ralf B. Bergmann, } "A fast and robust approach to phase shift registration from randomly phase shifted interferograms", Proc. SPIE 8413, Speckle 2012: V International Conference on Speckle Metrology, 84130R (11 September 2012); doi: 10.1117/12.978027; https://doi.org/10.1117/12.978027
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