Paper
11 September 2012 Measurement of the roughness surface using the normalized autocorrelation function of the fields of the texture of speckle pattern
Author Affiliations +
Proceedings Volume 8413, Speckle 2012: V International Conference on Speckle Metrology; 84131P (2012) https://doi.org/10.1117/12.978077
Event: SPECKLE 2012: V International Conference on Speckle Metrology, 2012, Vigo, Spain
Abstract
We present a new method of measure of the roughness based on the analysis of the texture of speckle pattern on the surface. Images of speckle pattern over the surface are captured by means of a simple configuration using a laser, beam expander, and a camera charge coupled device (CCD). Using the properties of the normalized covariance function that we obtain from the image of the speckle through the inverse Fourier transform, we relate the values of the normalized covariance function. We compare the results obtained with the results obtained with a confocal microscope. This method can be considered as a noncontact surface profiling method and is easy to implement and can be used during the manufacturing process.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Abdiel O. Pino and Josep Pladellorens "Measurement of the roughness surface using the normalized autocorrelation function of the fields of the texture of speckle pattern", Proc. SPIE 8413, Speckle 2012: V International Conference on Speckle Metrology, 84131P (11 September 2012); https://doi.org/10.1117/12.978077
Lens.org Logo
CITATIONS
Cited by 2 patents.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Speckle pattern

Surface roughness

Speckle

Confocal microscopy

Microscopes

Fourier transforms

Manufacturing

RELATED CONTENT


Back to Top