Translator Disclaimer
Paper
25 January 2012 High spatial resolution x-ray image detector for non-destructive examination of materials
Author Affiliations +
Proceedings Volume 8414, Photonics and Micro- and Nano-structured Materials 2011; 84140P (2012) https://doi.org/10.1117/12.923470
Event: Photonics and Micro- and Nano- structured Materials 2011, 2011, Yerevan, Armenia
Abstract
A high spatial resolution X-ray image detector is designed and costructed. The detector consists of a scintillator, light microscopy optics and charge-coupled device (CCD). The scintillator has a mosaic form with 4x5 mm2 area and consists of 1x1x0.3 mm3 elements fabricated from Y3Al5O12:Ce (YAG:Ce) and Gd3Ga5O12:Ce (GGG:Ce) bulk crystals. Using "Zemax" program the mirror-lens microscopic optical system is calculated and constructed. The Philips FTF4052M CCD has 4008(H) x 5344(V) active pixels (pixel size 9um) with sensitive area 36.072 mm x 48.096 mm. The detector has been characterized using visible-light images. X-ray images from a mosaic of scintillation crystals were also obtained. The estimated spatial resolution of the detector is 1 μm.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mkrtich A. Mkrtchyan and Ashot G. Petrosyan "High spatial resolution x-ray image detector for non-destructive examination of materials", Proc. SPIE 8414, Photonics and Micro- and Nano-structured Materials 2011, 84140P (25 January 2012); https://doi.org/10.1117/12.923470
PROCEEDINGS
6 PAGES


SHARE
Advertisement
Advertisement
Back to Top