15 October 2012 Parametric definition for the CGH patterns and error analysis in interferometric measurements
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Proceedings Volume 8415, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes; 841505 (2012) https://doi.org/10.1117/12.2010725
Event: 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012), 2012, Xiamen, China
Abstract
Computer-generated holograms are often used to test aspheric surfaces. This paper provides a parametric model for the CGH phase function using the exact geometric model. The phase function is then used to derive the sensitivity functions to alignment errors in testing. When using the CGH to test aspheric surface, it is important to separate the diffraction orders and only allow the desired order to pass the system. This paper also provides a recipe for determining the amount of carriers needed to eliminate the ghost images.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ping Zhou, Wenrui Cai, Chunyu Zhao, James H. Burge, "Parametric definition for the CGH patterns and error analysis in interferometric measurements", Proc. SPIE 8415, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes, 841505 (15 October 2012); doi: 10.1117/12.2010725; https://doi.org/10.1117/12.2010725
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