15 October 2012 Research on eliminating high-order spectrum in broadband miniature spectrometer system
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Proceedings Volume 8415, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes; 841506 (2012) https://doi.org/10.1117/12.975647
Event: 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012), 2012, Xiamen, China
Abstract
A dispersion spectrum order distribution model is established in order to eliminate the overlapping of broadband spectrum range among various dispersion orders in grating devices and the micro-array detector based miniature spectrometer system. Both step filters and the numeric filter are, respectively, designed to eliminate the high-order spectrum in such system. For the step-filter method, a novel filter design is introduced. The evaluation function of the design parameters is defined. Two kinds of step-filter are designed and manufactured by lithography and thin film coating. For the numeric-filter method, a calculation method of deducing the high-order spectra data is illustrated. The accuracy of this method depends on the measurement of diffraction efficiency ratio. A new measurement method based on Deuterium-Halogen light source and short-pass filter is accomplished. Both Mercury-Argon lamp and Tungsten Halogen lamp are used to verify the effect of these two methods. And the results show that both methods have notable effects in eliminating high-order spectra of broadband miniature spectrometer systems. The step-filter method is a physical method and has an advantage of real-time input and output. The numeric filter is a calculation method that does not reduce the intensity of the spectrum. Currently, the numeric filter method can be seen to have certain advantages compared with step-filter method used in broadband miniature spectrometer systems with wavelength range of visible to near-infrared.
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Kang Liu, Kang Liu, Feihong Yu, Feihong Yu, } "Research on eliminating high-order spectrum in broadband miniature spectrometer system", Proc. SPIE 8415, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes, 841506 (15 October 2012); doi: 10.1117/12.975647; https://doi.org/10.1117/12.975647
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