16 October 2012 Noise factor of microchannel plate with ion barrier film
Author Affiliations +
Proceedings Volume 8416, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies; 84162G (2012) https://doi.org/10.1117/12.977793
Event: 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012), 2012, Xiamen, China
Abstract
According to definition of noise factor of microchannel plate and the test principle, the authors set up a test installation, and measured the numerical values of MCPs which were made of different materials and channel pore including no / with ion barrier film in input of MCP. In order to seek the technical approach to reduce noise factor of MCP at the same time, we tested and analyzed the relation between noise factor and MCP voltage, combined relation between signal-to-noise ratio of GEN Ⅲ image intensifier and MCP voltage, open out relation between signal-to-noise ratio of GEN Ⅲ image intensifier and noise factor of MCP with ion barrier film.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Shu-lin Liu, Feng Shi, Zhou-kui Li, Yu-feng Zhu, Ni Zhang, Yan Gu, Jian-ning Sun, Xiao-qing Cong, Hui-min Zhao, Jing-sheng Pan, Yun-sheng Qian, Shao-cheng Zheng, Ben-kang Chang, "Noise factor of microchannel plate with ion barrier film", Proc. SPIE 8416, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 84162G (16 October 2012); doi: 10.1117/12.977793; https://doi.org/10.1117/12.977793
PROCEEDINGS
6 PAGES


SHARE
Back to Top