Paper
15 October 2012 Development of a computer-aided alignment simulator for an EO/IR dual-band airborne camera
Author Affiliations +
Proceedings Volume 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 84170E (2012) https://doi.org/10.1117/12.2002562
Event: 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012), 2012, Xiamen, China
Abstract
An airborne sensor is developed for remote sensing on an unmanned aerial vehicle (UAV). The sensor is an optical payload for an eletro-optical/infrared (EO/IR) dual band camera that combines visible and IR imaging capabilities in a compact and lightweight manner. It adopts a Ritchey-Chrétien telescope for the common front end optics with several relay optics that divide and deliver EO and IR bands to a charge-coupled-device (CCD) and an IR detector, respectively. For the easy assemble of such a complicated optics, a computer-aided alignment program (herein called simulator) is developed. The simulator first estimates the details of the misalignments such as locations, types, and amounts from the test results such as modulation transfer function (MTF), Zernike polynomial coefficients, and RMS wavefront errors at different field positions. Then it recommends the compensator movement(s) with the estimated optical performance. The simulator is coded on Matlab with the hidden connection to optical analysis/design software Zemax. By interfacing ZEMAX and MATLAB, the GUI-based alignment simulator, will help even those not familiar with the two programs to obtain accurate results more easily and quickly.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jun Ho Lee, Seungyeol Ryoo, Kwang-Woo Park, and Haeng Bok Lee "Development of a computer-aided alignment simulator for an EO/IR dual-band airborne camera", Proc. SPIE 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 84170E (15 October 2012); https://doi.org/10.1117/12.2002562
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KEYWORDS
Computer simulations

Modulation transfer functions

Error analysis

Device simulation

Zemax

Mirrors

Cameras

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