15 October 2012 Analyze and research the Moire fringe with information entropy theory
Author Affiliations +
Proceedings Volume 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 84170O (2012) https://doi.org/10.1117/12.965545
Event: 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012), 2012, Xiamen, China
Abstract
To improve the accuracy of the measuring system of long focal length, the coordinate of the special spectrum point should be found. In this paper a method based on information entropy is proposed, the feasibility of the method is proved in mathematics, analysis of the moire fringes and the result of the two-dimensional FFT of moire fringes is presented, the process of finding the exactly coordinate of the frequency domain, which is based on the method, is shown. We also demonstrate an application of the method to the measuring system, and numerical result of the experiment could prove that the accurate of the system is significantly improved.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Honglei Yu, Xiaorong Jin, Jian Bai, Hao Hu, "Analyze and research the Moire fringe with information entropy theory", Proc. SPIE 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 84170O (15 October 2012); doi: 10.1117/12.965545; https://doi.org/10.1117/12.965545
PROCEEDINGS
6 PAGES


SHARE
RELATED CONTENT

A scene recognition method based on image complexity
Proceedings of SPIE (September 18 2014)
Imagery super-resolution: emerging prospects
Proceedings of SPIE (December 01 1991)
Inverse moire
Proceedings of SPIE (September 17 1997)
A new finding about the coupled fringes of off plane...
Proceedings of SPIE (February 10 2005)
Real-time phase distribution analysis of fringe patterns
Proceedings of SPIE (September 29 1998)
Changed Parameter Method In Photomechanics
Proceedings of SPIE (January 16 1989)

Back to Top