Novel determination method of laser damage threshold

Lihong Yang; Wei Shi; Junhong Su

doi:10.1117/12.977939

15 October 2012 Novel determination method of laser damage threshold

Lihong Yang, Wei Shi, Junhong Su

Proceedings Volume 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 84171Q (2012) https://doi.org/10.1117/12.977939
Event: 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012), 2012, Xiamen, China

Abstract

The determination method of laser damage of thin film and the evaluation method of damage threshold are indispensable for enhancing anti-laser ability of infrared system observation window and its operating performance. A novel method for determining laser damage threshold of thin film is proposed. Firstly, by using the two images that has taken from CCD before and after laser illumination, the method realizes the image matching the damaged image and the undamaged image which is regarded as template image through the control point examination and the affine transformation. Secondly, the damage threshold of thin film is examined through analyzing the average gray level and standard deviation of various regions of the image. Finally, a algorithm based on template image match is established. The research on examining the damage threshold for substrate Si shows that the method, which combine with image match calibration technology, is simple and feasible, and can be used to determinate the damage threshold of thin film.

Citation Download Citation

Lihong Yang, Wei Shi, and Junhong Su "Novel determination method of laser damage threshold", Proc. SPIE 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 84171Q (15 October 2012); https://doi.org/10.1117/12.977939

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