Application and Research of d/0 measuring condition on spectrophotometer

Wang Cong; Shang-zhong Jin; Kun Yuan; Shi-zhi Gao; Yi-ping Wu

doi:10.1117/12.975800

15 October 2012 Application and Research of d/0 measuring condition on spectrophotometer

Wang Cong, Shang-zhong Jin, Kun Yuan, Shi-zhi Gao, Yi-ping Wu

Proceedings Volume 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 84172L (2012) https://doi.org/10.1117/12.975800
Event: 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012), 2012, Xiamen, China

Abstract

Standard measuring condition of d/0 structure has been widely applied on spectrophotometer. Ordinarily, in order to eliminate the impact of light source fluctuation, the inner surface of integrating sphere is selected as reference in the design of integrating sphere system. This design ensures the temporal stability of measurement. But the reflected light of inner surface and diffuse reflection light of sample are both detected as reference signal. It greatly impacts repeatability and error of indication. This paper improves d/0 measuring condition configuration with LEDs light source, and finds the method to reduce the error considering light source and integrating sphere. Then this paper simulates the configuration and establishes experiment for it. The results indicates that this configuration can effectively revise the error which carried by the diffuse light.

Citation Download Citation

Wang Cong, Shang-zhong Jin, Kun Yuan, Shi-zhi Gao, and Yi-ping Wu "Application and Research of d/0 measuring condition on spectrophotometer", Proc. SPIE 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 84172L (15 October 2012); https://doi.org/10.1117/12.975800

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