15 October 2012 Research on simulation system with the wide range and high-precision laser energy characteristics
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Proceedings Volume 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 841739 (2012) https://doi.org/10.1117/12.971198
Event: 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012), 2012, Xiamen, China
Abstract
The Hardware-in-the-loop(HWIL) simulation test is one of the important parts for the development and performance testing of semi-active laser-guided weapons. In order to obtain accurate results, the confidence level of the target environment should be provided for a high-seeker during the HWIL simulation test of semi-active laser-guided weapons, and one of the important simulation parameters is the laser energy characteristic. In this paper, based on the semi-active laser-guided weapon guidance principles, an important parameter of simulation of confidence which affects energy characteristics in performance test of HWIL simulation was analyzed. According to the principle of receiving the same energy by using HWIL simulation and in practical application, HWIL energy characteristics simulation systems with the crystal absorption structure was designed. And on this basis, the problems of optimal design of the optical system were also analyzed. The measured results show that the dynamic attenuation range of the system energy is greater than 50dB, the dynamic attenuation stability is less than 5%, and the maximum energy changing rate driven by the servo motor is greater than 20dB/s.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ke-yan Dong, Ke-yan Dong, Yan Lou, Yan Lou, Jing-yi He, Jing-yi He, Shou-feng Tong, Shou-feng Tong, Hui-lin Jiang, Hui-lin Jiang, } "Research on simulation system with the wide range and high-precision laser energy characteristics", Proc. SPIE 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 841739 (15 October 2012); doi: 10.1117/12.971198; https://doi.org/10.1117/12.971198
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