Analysis to the measurement error on the index homogeneity of optical material

Zhiyuan Liao; Tingwen Xing; Zhixiang Liu

doi:10.1117/12.975921

15 October 2012 Analysis to the measurement error on the index homogeneity of optical material

Zhiyuan Liao, Tingwen Xing, Zhixiang Liu

Proceedings Volume 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 84173G (2012) https://doi.org/10.1117/12.975921
Event: 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012), 2012, Xiamen, China

Abstract

In order to get three-dimensional distribution of the optical material which has very high index homogeneity, measuring index homogeneity of the main direction of a sample, then opening a rectangle window in the sample to measure the index homogeneity of the window direction. Zernike circle polynomials are in widespread use for wavefront analysis because of their orthogonality over a circular pupil and their representation of balanced classical aberrations, for the main direction is circular, we use the Zernike circle polynomials to fit the main direction interferometric data. From result of fitting the main direction interferometric data, we find the measuring error which must be taken into account. So it is an important question how to choose the orthonormal polynomial for fitting the window direction interferometric data. Using the Zernike circle polynomials as the basis functions, the orthonormal polynomials of the rectangular pupil be obtained from the circle polynomials by the Gram–Schmidt orthogonalization process, using the first fifteen items of the orthonormal polynomials of the rectangular pupil fit the interferometric data of the window direction, we get a good fitting precision, find the measuring error of some samples considerable at the same.

Citation Download Citation

Zhiyuan Liao, Tingwen Xing, and Zhixiang Liu "Analysis to the measurement error on the index homogeneity of optical material", Proc. SPIE 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 84173G (15 October 2012); https://doi.org/10.1117/12.975921

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available