Design and analysis of diffractive optical elements for flattening of single modal Gaussian beams

Kewei Yin; Zhiqiang Huang; Wumei Lin; Tingwen Xing

doi:10.1117/12.975202

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15 October 2012 Design and analysis of diffractive optical elements for flattening of single modal Gaussian beams

Kewei Yin, Zhiqiang Huang, Wumei Lin, Tingwen Xing

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Proceedings Volume 8418, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Smart Structures, Micro- and Nano-Optical Devices, and Systems; 84180Q (2012) https://doi.org/10.1117/12.975202
Event: 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012), 2012, Xiamen, China

Abstract

A design method of diffractive optical element is presented for converting a single modal Gaussian beam into a flat-top beam in the far field of the source. The design is based on geometrical method and modified Gerchberg-Saxton method. Geometrical method derives from the conservation of energy and the constant optical path length. This method could supply initial phase distribution of the modified Gerchberg-Saxton method. To find the optimization design results, the modified Gerchberg-Saxton method is important to choose the feedback factor to increase the convergent speed. In addition, tolerances and limitations of such elements result in a reduction of the diffraction efficiency and as a result of stray light. Further study indicates that deviation of the laser wavelength, incident beam, and observation plane can greatly influence flat-top beam shaping quality. On the basis of theoretical and experimental results, limitations for the application of diffractive beam shaping elements are investigated.

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Kewei Yin, Zhiqiang Huang, Wumei Lin, and Tingwen Xing "Design and analysis of diffractive optical elements for flattening of single modal Gaussian beams", Proc. SPIE 8418, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Smart Structures, Micro- and Nano-Optical Devices, and Systems, 84180Q (15 October 2012); https://doi.org/10.1117/12.975202

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