15 October 2012 An automatic measuring system for the lifetime testing of infrared detectors
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In this paper, an automatic measuring system based on LABVIEW and PLC is introduced; it uses the mutual controls of Single-Chip computer (MCU) and LABVIEW to accomplish the electrical parameter measurements of infrared detectors. This system can realize the multiple parameter measurements of no less than 160 IR detectors, it can realize the collection and storage of results by the LABVIEW; and it can avoid the damage of the IR detector during the measurement. After thousands times of test, the results show that the system runs stably and it can meet the accurate parameter measurement of detector.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Lan Cao, Lan Cao, Haiyan Zhang, Haiyan Zhang, Xianliang Zhu, Xianliang Zhu, Haimei Gong, Haimei Gong, } "An automatic measuring system for the lifetime testing of infrared detectors", Proc. SPIE 8419, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy, 84191O (15 October 2012); doi: 10.1117/12.975762; https://doi.org/10.1117/12.975762


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