Paper
15 October 2012 Diffracted beam parameters of TE0 mode symmetrical MQW planar waveguide
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Proceedings Volume 8420, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical System Technologies for Manufacturing and Testing; 842004 (2012) https://doi.org/10.1117/12.975931
Event: 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012), 2012, Xiamen, China
Abstract
As the equivalent refractive index solution and the Fraunhofer approximation of scalar diffraction integral formula are engaged, the far field diffraction characteristics of TE0 mode symmetrical multiple quantum well planar waveguide is discussed. Based on the Fourier transform relation between the near field distribution and far field diffraction distribution, the relation among the near field half width, far field divergence half angle and beam propagation factor for non-paraxial light beam are analysed and some approximate relationship with definite physical meaning are presented. Then, the approximate characteristics of beam propagation factor, near field half width defined by equivalent matching efficiency and tangent value of far field divergence half angle defined by equivalent matching efficiency versus the number of potential well layers of TE0 mode symmetrical MQW planar waveguide are presented.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Fuyuan Guo, Lianhuang Li, and Hua Zheng "Diffracted beam parameters of TE0 mode symmetrical MQW planar waveguide", Proc. SPIE 8420, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical System Technologies for Manufacturing and Testing, 842004 (15 October 2012); https://doi.org/10.1117/12.975931
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KEYWORDS
Planar waveguides

Near field

Beam propagation method

Diffraction

Refractive index

Light wave propagation

Waveguides

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