7 November 2012 Optical fiber sensors fabricated by the focused ion beam technique
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Proceedings Volume 8421, OFS2012 22nd International Conference on Optical Fiber Sensors; 842173 (2012) https://doi.org/10.1117/12.974932
Event: OFS2012 22nd International Conference on Optical Fiber Sensor, 2012, Beijing, China
Abstract
Focused ion beam (FIB) is a highly versatile technique which helps to enable next generation of lab-on-fiber sensor technologies. In this paper, we demonstrate the application of FIB to precisely mill the fiber taper and end facet of both conventional single mode fiber (SMF) and photonic crystal fiber (PCF). Using this technique we fabricate a highly compact fiber-optic Fabry-Pérot (FP) refractive index sensor near the tip of a fiber taper, and a highly sensitive in-line temperature sensor in a PCF. We also demonstrate the potential of using FIB to selectively fill functional fluid into desired patterns of air holes in a PCF.
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Wu Yuan, Wu Yuan, Fei Wang, Fei Wang, Ole Bang, Ole Bang, } "Optical fiber sensors fabricated by the focused ion beam technique", Proc. SPIE 8421, OFS2012 22nd International Conference on Optical Fiber Sensors, 842173 (7 November 2012); doi: 10.1117/12.974932; https://doi.org/10.1117/12.974932
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