10 May 2012 Low-frequency noise and microplasma measurements as a faster tool to investigate the quality of monocrystalline-silicon solar cells
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Abstract
Two sets of c-Si solar cells varying in front side phosphorus doped emitters were produced by standard screen printing technique. The first group of samples 3121 was prepared by combination of standard washing and bath with and highly dilute HF before diffusion of n+-emitter. The second group of samples 3122 was treated only with standard washing. This paper brings the comparison of solar cell conversion efficiency and results from a noise spectroscopy and microplasma presence. As it was already shown in previous publications [1-3] noise spectral density reflects the quality of solar cells and thus it represents an alternative advanced cell diagnostic tool. Our results confirm this relationship and moreover bring the clear evidence for the maximum spectral noise voltage density being related with the emitter structure. The best results were reached for a group of solar cell with of samples 3122 was treated only with standard washing.
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Z. Chobola, Z. Chobola, M. Lunák, M. Lunák, V. Juranková, V. Juranková, J. Vanek, J. Vanek, R. Barinka, R. Barinka, "Low-frequency noise and microplasma measurements as a faster tool to investigate the quality of monocrystalline-silicon solar cells", Proc. SPIE 8431, Silicon Photonics and Photonic Integrated Circuits III, 843129 (10 May 2012); doi: 10.1117/12.945977; https://doi.org/10.1117/12.945977
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