Paper
9 May 2012 PbTe(In) films with variable microstructure for photodetection in IR and terahertz range
Ludmila Ryabova, Vladimir Chernichkin, Alexandr Dobrovolsky, Vladimir Kasiyan, Vasily Bel'kov, Sergey Danilov, Zinovi Dashevsky, Sergei Ganichev, Dmitry Khokhlov
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Abstract
The work deals with studies of the grain size and surface state effect on photoelectric and transport properties of PbTe(In) films in the temperature range from 4.2 K up to 200 K under irradiation of a blackbody source and terahertz laser pulses. The PbTe(In) films were deposited on insulating substrates kept at the temperatures TS equal to -120 (see manuscript) 250C. AFM, SEM, Auger spectroscopy and X-ray diffraction were used to study the film microstructure. Increase of the TS value led to mean grain size growth from 60 up to 300 nm. All films had a column-like structure with the columns nearly perpendicular to the substrate plane. It is shown that microstructure of the films strongly affects the photoconductivity character in the terahertz region of the spectrum. Positive persistent photoresponse is observed at low temperatures in the polycrystalline films. For these films transport and photoelectric properties are determined by the grain volume and impurity state specifics. Nanocrystalline films have all features of non-homogeneous systems with band modulation. For these films only negative photoconductivity is observed in the whole temperature range. Possible mechanisms of the photoresponse formation are discussed.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ludmila Ryabova, Vladimir Chernichkin, Alexandr Dobrovolsky, Vladimir Kasiyan, Vasily Bel'kov, Sergey Danilov, Zinovi Dashevsky, Sergei Ganichev, and Dmitry Khokhlov "PbTe(In) films with variable microstructure for photodetection in IR and terahertz range", Proc. SPIE 8439, Optical Sensing and Detection II, 84391H (9 May 2012); https://doi.org/10.1117/12.922046
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Cited by 3 scholarly publications.
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KEYWORDS
Pulsed laser operation

Scanning electron microscopy

Temperature metrology

Atomic force microscopy

Doping

Lead

Photodetectors

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