Optoelectronic phase noise measurement system with wideband analysis

Patrice Salzenstein; Abdelhamid Hmima; Mikhail Zarubin; Ekaterina Pavlyuchenko; Nathalie Cholley

doi:10.1117/12.921630

9 May 2012 Optoectronic phase noise measurement system with wideband analysis

Patrice Salzenstein, Abdelhamid Hmima, Mikhail Zarubin, Ekaterina Pavlyuchenko, Nathalie Cholley

Proceedings Volume 8439, Optical Sensing and Detection II; 84391M (2012) https://doi.org/10.1117/12.921630
Event: SPIE Photonics Europe, 2012, Brussels, Belgium

Abstract

The use of a shorter delay line in a optoelectronic phase noise measurement system working in X-band, allow a characterization of the phase noise far from the carrier. Fourier frequency analysis can be extended from 10⁵ to 2.10⁶ Hz by introducing a 100 m delay line in addition of a 2 km optical fiber.

Citation Download Citation

Patrice Salzenstein, Abdelhamid Hmima, Mikhail Zarubin, Ekaterina Pavlyuchenko, and Nathalie Cholley "Optoectronic phase noise measurement system with wideband analysis", Proc. SPIE 8439, Optical Sensing and Detection II, 84391M (9 May 2012); https://doi.org/10.1117/12.921630

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