17 September 2012 The silicon micro-strip detector plane for the LOFT/wide-field monitor
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Abstract
The main objective of the Wide Field Monitor (WFM) on the LOFT mission is to provide unambiguous detection of the high-energy sources in a large field of view, in order to support science operations of the LOFT primary instrument, the LAD. The monitor will also provide by itself a large number of results on the timing and spectral behavior of hundreds of galactic compact objects, Active Galactic Nuclei and Gamma-Ray Bursts. The WFM is based on the coded aperture concept where a position sensitive detector records the shadow of a mask projected by the celestial sources. The proposed WFM detector plane, based on Double Sided micro-Strip Silicon Detectors (DSSD), will allow proper 2-dimensional recording of the projected shadows. Indeed the positioning of the photon interaction in the detector with equivalent fine resolution in both directions insures the best imaging capability compatible with the allocated budgets for this telescope on LOFT. We will describe here the overall configuration of this 2D-WFM and the design and characteristics of the DSSD detector plane including its imaging and spectral performances. We will also present a number of simulated results discussing the advantages that this configuration offers to LOFT. A DSSD-based WFM will in particular reduce significantly the source confusion experienced by the WFM in crowded regions of the sky like the Galactic Center and will in general increase the observatory science capability of the mission.
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A. Goldwurm, P. Ferrando, D. Götz, P. Laurent, F. Lebrun, O. Limousin, S. Basa, W. Bertoli, Eric Delagnes, Y. Dolgorouky, O. Gevin, A. Gros, C. Gouiffes, F. Jeanneau, C. Lachaud, M. Llored, C. Olivetto, G. Prevot, D. Renaud, J. Rodriguez, C. Rossin, S. Schanne, S. Soldi, P. Varniere, "The silicon micro-strip detector plane for the LOFT/wide-field monitor", Proc. SPIE 8443, Space Telescopes and Instrumentation 2012: Ultraviolet to Gamma Ray, 84432H (17 September 2012); doi: 10.1117/12.925251; https://doi.org/10.1117/12.925251
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KEYWORDS
Sensors

Capacitance

Imaging systems

Signal to noise ratio

Cameras

Point spread functions

Silicon

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