Development of fast data processing electronics for a stacked x-ray detector system with application as a polarimeter

Daniel Maier; Jürgen Dick; Giuseppe Distratis; Eckhard Kendziorra; Andrea Santangelo; Thomas Schanz; Christoph Tenzer; Gabriele Warth

doi:10.1117/12.926819

17 September 2012 Development of fast data processing electronics for a stacked x-ray detector system with application as a polarimeter

Daniel Maier, Jürgen Dick, Giuseppe Distratis, Eckhard Kendziorra, Andrea Santangelo, Thomas Schanz, Christoph Tenzer, Gabriele Warth

Author Affiliations +

Proceedings Volume 8443, Space Telescopes and Instrumentation 2012: Ultraviolet to Gamma Ray; 84435K (2012) https://doi.org/10.1117/12.926819
Event: SPIE Astronomical Telescopes + Instrumentation, 2012, Amsterdam, Netherlands

Abstract

We have assembled a stacked setup consisting of a soft and hard X-ray detector with cooling capability and control-, readout-, and data processing electronics at the Institut für Astronomie und Astrophysik Tübingen (IAAT). The detector system is a 64 ×64 DePFET-Matrix in front of a CdTe-Caliste module. The detectors were developed at the Max-Planck Institute Semiconductor Laboratory (HLL) in Neuperlach and the Commissariat a l'Energie Atomique (CEA) in Saclay, respectively. In this combined structure the DePFET detector works as Low Energy Detector (LED) while the Caliste module (HED) only detects the high energy photons that have passed through the LED. In this work we present the current status of the setup. Furthermore, an intended application of the detector system as a polarimeter is described.

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Daniel Maier, Jürgen Dick, Giuseppe Distratis, Eckhard Kendziorra, Andrea Santangelo, Thomas Schanz, Christoph Tenzer, and Gabriele Warth "Development of fast data processing electronics for a stacked x-ray detector system with application as a polarimeter", Proc. SPIE 8443, Space Telescopes and Instrumentation 2012: Ultraviolet to Gamma Ray, 84435K (17 September 2012); https://doi.org/10.1117/12.926819

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