Features of a laser metrology subsystem for astrometric telescopes

Alberto Riva; Mario Gai; Mario G. Lattanzi

doi:10.1117/12.926181

17 September 2012 Features of a laser metrology subsystem for astrometric telescopes

Alberto Riva, Mario Gai, Mario G. Lattanzi

Proceedings Volume 8444, Ground-based and Airborne Telescopes IV; 84445A (2012) https://doi.org/10.1117/12.926181
Event: SPIE Astronomical Telescopes + Instrumentation, 2012, Amsterdam, Netherlands

Abstract

In astrometric instrumentation a laser subsystem may be used for precise metrology of instrumental response. Such subsystems do not require diraction limited imaging, but can be tailored to specic application needs. We describe an interferometric arrangement for high precision monitoring of telescope line of sight and evaluate its performance as a function of some design parameters. We deduce that good sensitivity can be achieved over a signicant range of e.g. focusing conditions, provided proper cautions are adopted for detection and data processing.

Citation Download Citation

Alberto Riva, Mario Gai, and Mario G. Lattanzi "Features of a laser metrology subsystem for astrometric telescopes", Proc. SPIE 8444, Ground-based and Airborne Telescopes IV, 84445A (17 September 2012); https://doi.org/10.1117/12.926181

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available