17 September 2012 Features of a laser metrology subsystem for astrometric telescopes
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Abstract
In astrometric instrumentation a laser subsystem may be used for precise metrology of instrumental response. Such subsystems do not require diraction limited imaging, but can be tailored to specic application needs. We describe an interferometric arrangement for high precision monitoring of telescope line of sight and evaluate its performance as a function of some design parameters. We deduce that good sensitivity can be achieved over a signicant range of e.g. focusing conditions, provided proper cautions are adopted for detection and data processing.
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Alberto Riva, Mario Gai, Mario G. Lattanzi, "Features of a laser metrology subsystem for astrometric telescopes", Proc. SPIE 8444, Ground-based and Airborne Telescopes IV, 84445A (17 September 2012); doi: 10.1117/12.926181; https://doi.org/10.1117/12.926181
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