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12 September 2012 Geometrical model fitting for interferometric data: GEM-FIND
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We developed the tool GEM-FIND that allows to constrain the morphology and brightness distribution of ob- jects. The software fits geometrical models to spectrally dispersed interferometric visibility measurements in the N-band using the Levenberg-Marquardt minimization method. Each geometrical model describes the bright- ness distribution of the object in the Fourier space using a set of wavelength-independent and/or wavelength- dependent parameters. In this contribution we numerically analyze the stability of our nonlinear fitting approach by applying it to sets of synthetic visibilities with statistically applied errors, answering the following questions: How stable is the parameter determination with respect to (i) the number of uv-points, (ii) the distribution of points in the uv-plane, (iii) the noise level of the observations?
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Daniela Klotz, Stephane Sacuto, Claudia Paladini, Josef Hron, and Georg Wachter "Geometrical model fitting for interferometric data: GEM-FIND", Proc. SPIE 8445, Optical and Infrared Interferometry III, 84451A (12 September 2012);

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