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24 September 2012 A cryogenic set-up for accurate measurements of S-parameters
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Abstract
We have developed a set-up to perform measurements of S-parameters on devices operated at low temperature, using a Vector Network Analyzer in combination with a cryogenic chamber. High accuracy in the characterization of the devices is obtained using a set of TRL calibration standards operated at the same cryogenic temperature of the DUT. Measurements have been performed on Front-End-Modules of mm-wave receivers including cryogenic LNA developed within our collaboration.
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M. Zannoni, A. Baù, A. Passerini, A. Tartari, M. Gervasi, and L. Valenziano "A cryogenic set-up for accurate measurements of S-parameters", Proc. SPIE 8452, Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy VI, 84522R (24 September 2012); https://doi.org/10.1117/12.925995
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