Thin Film Solar Technology IV
Editor(s): Louay A. Eldada
Proceedings Volume 8470 is from: Logo
12-16 August 2012
San Diego, California, United States
Front Matter: Volume 8470
Proc. SPIE 8470, Front Matter: Volume 8470, 847001 (31 October 2012);
Advances in Thin Film Silicon PV
Proc. SPIE 8470, Double-pulsed PECVD synthesis of hydrogenated nanocrystalline silicon thin films, 847007 (10 October 2012);
Proc. SPIE 8470, Experiments with resonant thin-film hydrogenated amorphous silicon solar cells, 847008 (15 October 2012);
Proc. SPIE 8470, High-rate deposition of silicon thin film layers using linear plasma sources operated at very high excitation frequencies (80-140 MHz), 847009 (10 October 2012);
Advances in c-Si PV
Proc. SPIE 8470, Silicon epitaxy below 200°C: towards thin crystalline solar cells, 84700B (10 October 2012);
Proc. SPIE 8470, Best practice quality control in solar module back sheet production, 84700D (10 October 2012);
Novel PV Materials and Characterization Methods
Proc. SPIE 8470, High quality SnS van der Waals epitaxies on graphene buffer layer, 84700E (15 October 2012);
Proc. SPIE 8470, Characterization and quality control of semiconductor wafers using time-correlated single photon counting, 84700F (10 October 2012);
Proc. SPIE 8470, Variable temperature Hall measurements on low-mobility materials, 84700G (10 October 2012);
Proc. SPIE 8470, Optical and structural properties of silver doped ZnSe thin films prepared by CSS and ion exchange process, 84700H (10 October 2012);
Proc. SPIE 8470, Properties of the thin-film solar cells with heterojunctions Cu2S-Cd1-xZnxS and Cu2Se-Cd1-xZnxSe, 84700I (10 October 2012);
CIGS PV Modeling, Fabrication, and Characterization
Proc. SPIE 8470, Understanding CIGS device performances through photoreflectance spectroscopy, 84700L (10 October 2012);
Proc. SPIE 8470, Investigation of the (Cu,Ga)InSe2 thin film with different pairs of CuGa/In sputtered layers, 84700M (10 October 2012);
Transparent Conducting Oxides
Proc. SPIE 8470, Transparent conducting materials: overview and recent results, 84700P (10 October 2012);
Proc. SPIE 8470, Extraction of optical properties and thickness of silicon-rich oxide films from ellipsometry measurement, 84700S (10 October 2012);
Proc. SPIE 8470, Novel techniques to improve the light harvesting of thin film solar cells, 847011 (10 October 2012);
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