Recent advances in the reliability of OTFTs

Patrick Too; Herve Vandekerckhove; Guillaume Fichet; M. James Harding; Michael J. Banach

doi:10.1117/12.930013

11 October 2012 Recent advances in the reliability of OTFTs

Patrick Too, Herve Vandekerckhove, Guillaume Fichet, M. James Harding, Michael J. Banach

Proceedings Volume 8478, Organic Field-Effect Transistors XI; 847807 (2012) https://doi.org/10.1117/12.930013
Event: SPIE Organic Photonics + Electronics, 2012, San Diego, California, United States

Abstract

In this paper, we present the results of achieving stable organic thin film transistors (OTFTs) under bias stress conditions. We discuss the various factors that have been found to influence the operational stability of the OTFT. This has enabled Plastic Logic to achieve a reliable active matrix backplane on low cost flexible substrates which is a key enabler for electronic paper displays.

Citation Download Citation

Patrick Too, Herve Vandekerckhove, Guillaume Fichet, M. James Harding, and Michael J. Banach "Recent advances in the reliability of OTFTs", Proc. SPIE 8478, Organic Field-Effect Transistors XI, 847807 (11 October 2012); https://doi.org/10.1117/12.930013

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available