Assessment of particle deposition inside payload fairing from launch vehicle plume contribution

De-Ling Liu; Stephen V. Didziulis; Jesse D. Fowler

doi:10.1117/12.931022

15 October 2012 Assessment of particle deposition inside payload fairing from launch vehicle plume contribution

De-Ling Liu, Stephen V. Didziulis, Jesse D. Fowler

Proceedings Volume 8492, Optical System Contamination: Effects, Measurements, and Control 2012; 84920F (2012) https://doi.org/10.1117/12.931022
Event: SPIE Optical Engineering + Applications, 2012, San Diego, California, United States

Abstract

Concerns were raised for potential payload contamination inside payload faring (PLF) contributed from the soot particles in the launch vehicle ignition plume. Soot particles, once ingested into PLF through vents, can pose potential payload contamination risks due to their light absorbing characteristics. To gain insights into the extent of soot particle contamination inside the PLF, analytical calculations and laboratory experiments were performed using a PLF simulator to determine the rate of soot particle deposition onto surfaces. The analysis assumed a non-venting setting as the worst case scenario, in which particles were trapped inside the PLF simulator and allowed to deposit onto available surfaces. Soot particles were briefly introduced inside a PLF mockup and after the soot generation source ceased, particle deposition rates were examined by measuring the particle concentration decay as a function of time. Based on the experimentally determined particle deposition rates and other parameters including the venting scenarios, the impact of soot particle deposition for the full scale PLF and payload was evaluated. The effects of soot particles contamination were also studied, and pronounced transmission degradation toward the UV region on a fused silica substrate was observed.

Citation Download Citation

De-Ling Liu, Stephen V. Didziulis, and Jesse D. Fowler "Assessment of particle deposition inside payload fairing from launch vehicle plume contribution", Proc. SPIE 8492, Optical System Contamination: Effects, Measurements, and Control 2012, 84920F (15 October 2012); https://doi.org/10.1117/12.931022

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