15 October 2012 Development of grating-based hard x-ray Talbot interferometry for optics and beam wavefront characterization at the advanced photon source
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Abstract
Here we report on the effort to develop a hard x-ray grating interferometry technique for application to hard x-ray optics and wavefront characterization at the Advanced Photon Source (APS), Argonne National Laboratory, USA. We will mention the motivation for developing an x-ray interferometer at the APS and discuss the design of the interferometer. We will also describe the efforts in fabricating 2-D gratings and a new type of grating having nanometer periods for high-energy x-ray applications. The preliminary results obtained using x-ray Talbot interferometers built at APS, using a broadband (pink) beam and a monochromatic beam demonstrate the importance of this tool as a metrology instrument for optics and beam wavefront diagnostics.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Shashidhara Marathe, Shashidhara Marathe, Michael J. Wojcik, Michael J. Wojcik, Naresh G. Kujala, Naresh G. Kujala, Albert T. Macrander, Albert T. Macrander, Han H. Wen, Han H. Wen, Chian Liu, Chian Liu, Kamel Fezzaa, Kamel Fezzaa, Ralu Divan, Ralu Divan, Derrick C. Mancini, Derrick C. Mancini, Lahsen Assoufid, Lahsen Assoufid, } "Development of grating-based hard x-ray Talbot interferometry for optics and beam wavefront characterization at the advanced photon source", Proc. SPIE 8501, Advances in Metrology for X-Ray and EUV Optics IV, 85010J (15 October 2012); doi: 10.1117/12.974896; https://doi.org/10.1117/12.974896
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