X-ray wavefront characterization with two-dimensional wavefront sensors: shearing interferometers and Hartmann wavefront sensors

Kevin L. Baker

doi:10.1117/12.945986

15 October 2012 X-ray wavefront characterization with two-dimensional wavefront sensors: shearing interferometers and Hartmann wavefront sensors

Kevin L. Baker

Author Affiliations +

Proceedings Volume 8503, Adaptive X-Ray Optics II; 85030G (2012) https://doi.org/10.1117/12.945986
Event: SPIE Optical Engineering + Applications, 2012, San Diego, California, United States

Abstract

Phase reconstructions from a two-dimensional shearing interferometer, based on two orthogonal phase gratings in a single plane, and a Hartmann sensor are compared. Design alternatives for both wavefront sensors are given and simulated performance of both the two-dimensional x-ray shearing interferometer and Hartmann wavefront sensor are presented for two different phase profiles. The first comparison is an evaluation of metrology on DT ice layers in an inertial confinement fusion capsule and the second comparison is a high frequency "asterisk" phase profile. Both of these sensors can measure the two-dimensional wave-front gradient of an x-ray beam, as well as the x-ray absorption. These instruments measure the two-dimensional wave-front gradient in a single measurement and the wavefront sensor is located in a single plane making them much less sensitive to vibrations than most other wavefront sensing techniques.

Citation Download Citation

Kevin L. Baker "X-ray wavefront characterization with two-dimensional wavefront sensors: shearing interferometers and Hartmann wavefront sensors", Proc. SPIE 8503, Adaptive X-Ray Optics II, 85030G (15 October 2012); https://doi.org/10.1117/12.945986

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