PROCEEDINGS VOLUME 8504
SPIE OPTICAL ENGINEERING + APPLICATIONS | 12-16 AUGUST 2012
X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications
Editor Affiliations +
IN THIS VOLUME

8 Sessions, 20 Papers, 0 Presentations, 0 Posters
Optics I  (2)
Detectors  (2)
Applications  (4)
Lasers  (3)
Proceedings Volume 8504 is from: Logo
SPIE OPTICAL ENGINEERING + APPLICATIONS
12-16 August 2012
San Diego, California, United States
Front Matter: Volume 8504
Proceedings Volume X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, 850401 (2012) https://doi.org/10.1117/12.2012088
Diagnostics I
N. Duane Loh, Dmitri Starodub, Lukas Lomb, Christina Y. Hampton, Andrew V. Martin, Raymond G. Sierra, Anton Barty, Andrew Aquila, Joachim Schulz, et al.
Proceedings Volume X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, 850403 (2012) https://doi.org/10.1117/12.930075
Marco Zangrando, Alessandro Abrami, Daniele Cocco, Claudio Fava, Simone Gerusina, Riccardo Gobessi, Nicola Mahne, Eric Mazzucco, Lorenzo Raimondi, et al.
Proceedings Volume X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, 850404 (2012) https://doi.org/10.1117/12.929749
K. W. Hill, M. Bitter, L. Delgado-Aparicio, N. A. Pablant, P. Beiersdorfer, M. Sanchez del Rio, L. Zhang
Proceedings Volume X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, 850405 (2012) https://doi.org/10.1117/12.930063
Optics I
Sebastian Roling, Liubov Samoylova, Björn Siemer, Harald Sinn, Frank Siewert, Frank Wahlert, Michael Wöstmann, Helmut Zacharias
Proceedings Volume X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, 850407 (2012) https://doi.org/10.1117/12.965547
Brendan F. Murphy, Jean-Charles Castagna, John D. Bozek, Nora Berrah
Proceedings Volume X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, 850409 (2012) https://doi.org/10.1117/12.928538
Detectors
Philip Hart, Sébastien Boutet, Gabriella Carini, Mikhail Dubrovin, Brian Duda, David Fritz, Gunther Haller, Ryan Herbst, Sven Herrmann, et al.
Proceedings Volume X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, 85040C (2012) https://doi.org/10.1117/12.930924
M. Antonelli, M. Di Fraia, A. Tallaire, J. Achard, S. Carrato, R. H. Menk, G. Cautero, D. Giuressi, W. H. Jark, et al.
Proceedings Volume X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, 85040D (2012) https://doi.org/10.1117/12.929668
Applications
Andreas Schropp, Jens Patommel, Frank Seiboth, Brice Arnold, Eric C. Galtier, Hae Ja Lee, Bob Nagler, Jerome B. Hastings, Christian G. Schroer
Proceedings Volume X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, 85040F (2012) https://doi.org/10.1117/12.929882
Yi-De Chuang, Dionisio Doering, Alejandro G. Cruz, Nadeem Tahir, Nord C. Andresen, Ken P. Chow, Devis Contarato, Curtis L. Cummings, Edward E. Domning, et al.
Proceedings Volume X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, 85040G (2012) https://doi.org/10.1117/12.931492
Carl Caleman, Nicusor Tîmneanu, Andrew V. Martin, Thomas A. White, Howard A. Scott, Anton Barty, Andrew Aquila, Henry N. Chapman
Proceedings Volume X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, 85040H (2012) https://doi.org/10.1117/12.929294
Wojciech Roseker, Sooheyong Lee, Michael Walther, Horst Schulte-Schrepping, Hermann Franz, Amber Gray, Marcin Sikorski, Paul H. Fuoss, G. Brian Stephenson, et al.
Proceedings Volume X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, 85040I (2012) https://doi.org/10.1117/12.929759
Lasers
Max J. Lederer, Mikhail Pergament, Martin Kellert, Cruz Mendez
Proceedings Volume X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, 85040L (2012) https://doi.org/10.1117/12.928961
Mina R. Bionta, Doug French, James P. Cryan, James M. Glownia, Nick Hartmann, David J. Nicholson, Kevin Baker, Christoph Bostedt, Marco Cammarrata, et al.
Proceedings Volume X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, 85040M (2012) https://doi.org/10.1117/12.929097
Alexander Laskin, Vadim Laskin
Proceedings Volume X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, 85040N (2012) https://doi.org/10.1117/12.930274
Diagnostics II
Jan Grünert, Jens Buck, Cigdem Ozkan, Wolfgang Freund, Serguei Molodtsov
Proceedings Volume X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, 85040R (2012) https://doi.org/10.1117/12.929710
Yiping Feng, Diling Zhu, Jan M. Feldkamp, Henrik T. Lemke, Aymeric Robert, David M. Fritz, Marco Cammarata, Sooheyong Lee, Jerome B. Hastings, et al.
Proceedings Volume X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, 85040S (2012) https://doi.org/10.1117/12.930943
J. Buck, J. Viefhaus, F. Scholz, M. Ilchen, L. Glaser, C. Özkan, W. Freund, J. Grünert, S. Molodtsov
Proceedings Volume X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, 85040U (2012) https://doi.org/10.1117/12.929805
Poster Session
Yiping Feng, Diling Zhu, Aymeric Robert, Henrik T. Lemke, Matthieu Chollet, David M. Fritz, Jerome B. Hastings, Jan M. Feldkamp, Marco Cammarata, et al.
Proceedings Volume X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, 85040V (2012) https://doi.org/10.1117/12.930944
Cigdem Ozkan, Wolfgang Freund, Jens Rehanek, Jens Buck, Ivo Zizak, Jan Gruenert, Franz Schaefers, Alexei Erko, Serguei Molodtsov
Proceedings Volume X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, 85040X (2012) https://doi.org/10.1117/12.929755
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