PROCEEDINGS VOLUME 8504
SPIE OPTICAL ENGINEERING + APPLICATIONS | 12-16 AUGUST 2012
X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications
IN THIS VOLUME

8 Sessions, 20 Papers, 0 Presentations
Optics I  (2)
Detectors  (2)
Applications  (4)
Lasers  (3)
Proceedings Volume 8504 is from: Logo
SPIE OPTICAL ENGINEERING + APPLICATIONS
12-16 August 2012
San Diego, California, United States
Front Matter: Volume 8504
Proc. SPIE 8504, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, 850401 (13 November 2012); doi: 10.1117/12.2012088
Diagnostics I
Proc. SPIE 8504, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, 850403 (19 October 2012); doi: 10.1117/12.930075
Proc. SPIE 8504, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, 850404 (15 October 2012); doi: 10.1117/12.929749
Proc. SPIE 8504, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, 850405 (15 October 2012); doi: 10.1117/12.930063
Optics I
Proc. SPIE 8504, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, 850407 (15 October 2012); doi: 10.1117/12.965547
Proc. SPIE 8504, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, 850409 (15 October 2012); doi: 10.1117/12.928538
Detectors
Proc. SPIE 8504, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, 85040C (15 October 2012); doi: 10.1117/12.930924
Proc. SPIE 8504, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, 85040D (19 October 2012); doi: 10.1117/12.929668
Applications
Proc. SPIE 8504, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, 85040F (17 October 2012); doi: 10.1117/12.929882
Proc. SPIE 8504, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, 85040G (15 October 2012); doi: 10.1117/12.931492
Proc. SPIE 8504, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, 85040H (17 October 2012); doi: 10.1117/12.929294
Proc. SPIE 8504, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, 85040I (17 October 2012); doi: 10.1117/12.929759
Lasers
Proc. SPIE 8504, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, 85040L (15 October 2012); doi: 10.1117/12.928961
Proc. SPIE 8504, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, 85040M (15 October 2012); doi: 10.1117/12.929097
Proc. SPIE 8504, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, 85040N (19 October 2012); doi: 10.1117/12.930274
Diagnostics II
Proc. SPIE 8504, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, 85040R (15 October 2012); doi: 10.1117/12.929710
Proc. SPIE 8504, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, 85040S (15 October 2012); doi: 10.1117/12.930943
Proc. SPIE 8504, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, 85040U (15 October 2012); doi: 10.1117/12.929805
Poster Session
Proc. SPIE 8504, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, 85040V (17 October 2012); doi: 10.1117/12.930944
Proc. SPIE 8504, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, 85040X (15 October 2012); doi: 10.1117/12.929755
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