Time-of-flight photoemission spectroscopy from rare gases for
non-invasive, pulse-to-pulse x-ray photon diagnostics at the
European XFEL

J. Buck; J. Viefhaus; F. Scholz; M. Ilchen; L. Glaser; C. Özkan; W. Freund; J. Grünert; S. Molodtsov

doi:10.1117/12.929805

15 October 2012 Time-of-flight photoemission spectroscopy from rare gases for non-invasive, pulse-to-pulse x-ray photon diagnostics at the European XFEL

J. Buck, J. Viefhaus, F. Scholz, M. Ilchen, L. Glaser, C. Özkan, W. Freund, J. Grünert, S. Molodtsov

Author Affiliations +

Proceedings Volume 8504, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications; 85040U (2012) https://doi.org/10.1117/12.929805
Event: SPIE Optical Engineering + Applications, 2012, San Diego, California, United States

Abstract

The European X-ray Free Electron Laser (XFEL.EU) under construction will provide highly brilliant soft to hard X-ray (<280 eV - <20 keV) radiation with an intra-bunch train repetition rate of 4.5 MHz by employing the self-amplified spontaneous emission process. The resulting statistical fluctuations of important beam characteristics makes pulse-to-pulse diagnostics data of the photon beam a mandatory reference during user experiments. We present our concepts of analysing the photoemission from rare gases with a time-of-flight spectrometer for non-invasive, pulse-to-pulse measurements of the photon spectrum and polarization with a special emphasis on real-time processing with a low latency of ≤ 10−⁵ s.

Citation Download Citation

J. Buck, J. Viefhaus, F. Scholz, M. Ilchen, L. Glaser, C. Özkan, W. Freund, J. Grünert, and S. Molodtsov "Time-of-flight photoemission spectroscopy from rare gases for non-invasive, pulse-to-pulse x-ray photon diagnostics at the European XFEL", Proc. SPIE 8504, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, 85040U (15 October 2012); https://doi.org/10.1117/12.929805

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