Some structural and optical properties of thin and thick CdTe and CdxMn1-xTe films

A. S. Opanasyuk; P. V. Koval; V. V. Kosyak; P. M. Fochuk; A. E. Bolotnikov; R. B. James

doi:10.1117/12.929017

24 October 2012 Some structural and optical properties of thin and thick CdTe and Cd_xMn_1-xTe films

A. S. Opanasyuk, P. V. Koval, V. V. Kosyak, P. M. Fochuk, A. E. Bolotnikov, R. B. James

Author Affiliations +

Proceedings Volume 8507, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIV; 85071K (2012) https://doi.org/10.1117/12.929017
Event: SPIE Optical Engineering + Applications, 2012, San Diego, California, United States

Abstract

In work the complex investigation of structural and optical properties of CdTe and Cd1-xMnxTe semiconductor films deposited by close-spaced vacuum sublimation method using thermal evaporation on non-oriented substrates was carried out. The structural and phase analysis of the layers condensed at different substrate temperatures was performed.

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A. S. Opanasyuk, P. V. Koval, V. V. Kosyak, P. M. Fochuk, A. E. Bolotnikov, and R. B. James "Some structural and optical properties of thin and thick CdTe and Cd_xMn_1-xTe films", Proc. SPIE 8507, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIV, 85071K (24 October 2012); https://doi.org/10.1117/12.929017

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