19 October 2012 Single event upset injection simulation and fault-tolerant design for image compression applications
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Abstract
This paper describes a SEU fault injection framework. Based on the assumption of SEU effects and SEU distribution, the quantitative analysis between measured data and simulation model is investigated. By adjusting some parameters in the simulation-based framework, the proposed framework can be very possibly close to the published data and some accelerated radiation experiments. Furthermore, how the JPEG2000 based hardware architecture is sensitive to SEUs can be found out. In terms of hardware resources and operating frequencies, some fault-tolerant techniques can be introduced to the more sensitive parts, which show the framework's effectiveness in fault-tolerant design for image compression applications.
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Jie Guo, Jie Guo, Yunsong Li, Yunsong Li, Kai Liu, Kai Liu, Jie Lei, Jie Lei, Chengke Wu, Chengke Wu, } "Single event upset injection simulation and fault-tolerant design for image compression applications", Proc. SPIE 8514, Satellite Data Compression, Communications, and Processing VIII, 851403 (19 October 2012); doi: 10.1117/12.929470; https://doi.org/10.1117/12.929470
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