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15 October 2012 Advanced materials and device technology for photonic electric field sensors
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Abstract
Photonic methods for electric field sensing have been demonstrated across the electromagnetic spectrum from near-DC to millimeter waves, and at field strengths from microvolts-per-meter to megavolts-per-meter. The advantages of the photonic approach include a high degree of electrical isolation, wide bandwidth, minimum perturbation of the incident field, and the ability to operate in harsh environments.

Aerospace applications of this technology span a wide range of frequencies and field strengths. They include, at the high-frequency/high-field end, measurement of high-power electromagnetic pulses, and at the low-frequency/low-field end, in-flight monitoring of electrophysiological signals. The demands of these applications continue to spur the development of novel materials and device structures to achieve increased sensitivity, wider bandwidth, and greater high-field measurement capability.

This paper will discuss several new directions in photonic electric field sensing technology for defense applications. The first is the use of crystal ion slicing to prepare high-quality, single-crystal electro-optic thin films on low-dielectricconstant, RF-friendly substrates. The second is the use of two-dimensional photonic crystal structures to enhance the electro-optic response through slow-light propagation effects. The third is the use of ferroelectric relaxor materials with extremely high electro-optic coefficients.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
James E. Toney, Vincent E. Stenger, Stuart A. Kingsley, Andrea Pollick, Sri Sriram, and Edward Taylor "Advanced materials and device technology for photonic electric field sensors", Proc. SPIE 8519, Nanophotonics and Macrophotonics for Space Environments VI, 851904 (15 October 2012); https://doi.org/10.1117/12.930740
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