24 October 2012 Front Matter: Volume 8549
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Proceedings Volume 8549, 16th International Workshop on Physics of Semiconductor Devices; 854901 (2012); doi: 10.1117/12.926917
Event: 16th International Workshop on Physics of Semiconductor Devices, 2011, Kanpur, India
Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 8549, including the Title Page, Copyright information, Table of Contents, and the Conference Committee listing.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Proceedings of SPIE, "Front Matter: Volume 8549", Proc. SPIE 8549, 16th International Workshop on Physics of Semiconductor Devices, 854901 (24 October 2012); doi: 10.1117/12.926917; http://dx.doi.org/10.1117/12.926917
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KEYWORDS
Semiconductors

CMOS technology

Inkjet technology

Silicon carbide

Thin films

Electronics engineering

Field effect transistors

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